Single-shot imaging captures more information about ultrafast microscopic processes than previously possible

Researchers have developed a new imaging technique that captures more information about ultrafast processes in the ...
IEEE

Single event transient analysis of isolation problems for the high side devices in a 0.18μm BCD Process

Abstract: This paper presents a radiation-induced single event transient current simulation in a modern smart power BCD technology, which is interest for space applications. Two kinds of N-type Buried ...
IEEE

Process-Invariant Current Source Design: Methodology and Examples

Abstract: In this paper, we present a design methodology and resulting circuits that compensate for process variations without the need for post-fabrication efforts. We demonstrate how, using this ...