There is no doubt that the semiconductor industry is in an era of rapid and profound transformation, driven by an increasing ...
Abstract: Glass manufacturing processes often yield complex defects such as bubbles, stones, and scratches. While machine vision systems powered by deep learning offer effective defect detection, real ...
Abstract: This study proposes an anchor-free insulator defect detection method based on an Adaptive Defect Feature Enhancement Network (ADFE-Net) for rapid and precise defect identification. The ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results