Supply Chain Management Review

Predicting failure before it happens: A new playbook for transportation risk

Machine learning-driven carrier risk modeling enables supply chains to predict and prevent pickup defects, reducing costs and improving on-time performance.

India’s highways to get AI dashcams: A high-tech plan to track potholes and road damage across 40,000 kilometres

India’s highways are all set to get a tech boost. The National Highways Authority of India reportedly plans to install ...
Scientific Research Publishing

A Multimodal Machine-Learning Framework for Predicting Lithium-Associated Renal Dysfunction from Synthetic Biomarker Trajectories ()

Long-term lithium therapy remains the most effective maintenance treatment for bipolar disorder, yet it poses a significant ...
IEEE

Defect Detection and Correction in OpenMP: A Static Analysis and Machine Learning-Based Solution

Abstract: Concurrency defects such as race conditions, deadlocks, and improper synchronization remain a critical challenge in developing reliable OpenMP-based parallel applications. Traditional static ...
pv magazine International

US researchers use machine learning to detect hidden solar array defects

Researchers from Stony Brook University, in collaboration with Ecosuite and Ecogy Energy, have developed a self-supervised machine-learning algorithm designed to identify physical anomalies in solar ...
pv-magazine-usa

Machine learning models identify hidden physical defects in solar arrays

Researchers from Stony Brook University, in collaboration with Ecosuite and Ecogy Energy, have developed a self-supervised machine learning algorithm designed to identify physical anomalies in solar ...
IEEE

Machine Learning-Based Defect Detection, Output Matching Assessment, and Performance Recentering of a 79-GHz Four-Way CMOS Power Amplifier

Abstract: This work proposes the use of machine learning-based techniques for enhanced testability and performance calibration of an industrial 79-GHz power amplifier (PA) designed for an automotive ...
Scientific Research Publishing

BCN-YOLO: A Deep Learning Network for PCB Defect Detection ()

To address the issues of missed detection and false detection during the defect inspection process of the PCB, an improved YOLOv7-based algorithm for PCB defect detection is proposed. Firstly, the ...
Semiconductor Engineering

Detecting Slips, Scratches, Cracks In Wafers And Dies Becoming Harder

Defect detection requirements on the order of 10 defective parts per million (DPPM) are driving improvements in inspection tools’ resolution and throughput at foundries and OSATs. However, defects ...