Semiconductor Engineering

The Smart Advantage: How Artificial Intelligence Is Transforming Inspection And Metrology In Semiconductor Manufacturing

There is no doubt that the semiconductor industry is in an era of rapid and profound transformation, driven by an increasing ...
IEEE

Explainable Wafer Map Defect Classification Using Lightweight Data Augmentation and Convolutional Neural Network

Abstract: Wafer map defect classification is a crucial task in semiconductor manufacturing, as early detection of defects improves yield and minimizes production waste. This study proposes an enhanced ...
IEEE

Real-time Defect Detection for Fused Deposition Modeling based on Machine Learning

Abstract: FDM (Fused Deposition Modeling) 3D printing technology, as a type of additive manufacturing technology, is widely used in industrial production and scientific research and education. However ...