Scientists have developed a new method to measure ocean surface currents over large areas in greater detail than ever before. Called GOFLOW (Geostationary Ocean Flow), the approach applies deep ...
Abstract: Wafer map defect classification is a crucial task in semiconductor manufacturing, as early detection of defects improves yield and minimizes production waste. This study proposes an enhanced ...
Abstract: In recent years, the interest in underwater exploration with Autonomous Underwater Vehicles (AUVs) equipped with side-scan sonars (SSS) has grown considerably. However, state-of-the-art SSS ...