The world of nanoscale analysis has been revolutionized by the advent of electrical Atomic Force Microscopy (AFM) modes. New possibilities for measuring electrical properties with remarkable precision ...

In July 1985, three physicists—Gerd Binnig of the IBM Zurich Research Laboratory, Christoph Gerber of the University of Basel, and Calvin Quate of Stanford University—puzzled over a problem while ...

New hybrid nano-microscope by KRISS allows simultaneous measurement of optical and electrical properties. Expected to accelerate nano-scale research on advanced equipment and materials such as bilayer ...

Researchers from the National Institute of Standards and Technology (NIST), Gaithersburg, MD, working with colleagues from the National Aeronautics and Space Administration, the National Institute of ...

Scanning probe microscopes produce images based not on light, but on electron density and charge. Scientists are producing incredible images of tinyness heretofore visible only by means of an artist's ...

A team of researchers from the Korea Research Institute of Standards and Science (KRISS) has created a hybrid nano-microscope that can measure a variety of nano-material properties simultaneously.

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure AFSEM is an atomic force microscope (AFM ...

(Nanowerk News) The Korea Research Institute of Standards and Science (KRISS) has developed a hybrid nano-microscope capable of simultaneously measuring various nanomaterial properties. This ...