EDN

Dynamic test handler delivers precision positioning for LCD drivers

Tokyo, Japan — Advantest Corp. has introduced the M7522 dynamic test handler, which offers the industry's highest processing speed and positioning accuracy for fine-pitch tape automated bonding (TAB) ...
Nasdaq

Advantest Expands M4841 Handler with Active Thermal Control for Faster Device Throughput and Test Times

ATC 2.0 Option Enables Dynamic Multisite Sensing and Regulation of Device Temperature for Optimized Test of High-End Automotive SoCs TOKYO, Oct. 24, 2023 (GLOBE NEWSWIRE) -- Leading semiconductor test ...
EDN

Advantest doubles dynamic test handler throughput

Tokyo—Advantest Corp. has announced its M6242 dynamic test handler that provides throughput of 42,200 units per hour for high-volume production test of memory devices such as DRAM. The M6242 supports ...
Electronic Design

Keysight partners with IPTE for in-circuit test

Santa Rosa, CA. Keysight Technologies has announced it has partnered with IPTE Factory Automation to add automated in-circuit test (ICT) handlers to Keysight’s i1000 in-circuit test modules. With this ...