Scientists used Lorentz transmission electron microscopy (LTEM) to visualize topological defects. They were able to do so by passing electrons and observing their deflections through a thin magnetic ...

A technical paper titled “Accelerating Defect Predictions in Semiconductors Using Graph Neural Networks” was published by researchers at Purdue University, Indian Institute of Technology (IIT) Madras, ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Advancements in nanotechnology fabrication and characterization tools have facilitated a number of developments in the creation of new two-dimensional (2D) materials and gaining and understanding of ...

What if manufacturing companies could pinpoint the exact cause of a defect the moment it occurs, preventing costly production delays and ensuring top-notch quality? Generative artificial intelligence ...

There is an expectation from consumers that today’s electronic products will just work and that electronic manufacturers have continued to improve the quality of their products. In most cases, this ...