I'm trying to figure out the polynomial used for generating a CRC. At least I think it's a CRC. In one test case, a single bit change cause a change in 2 bytes of the syspected 32 bit CRC. Any other ...
Built-in self-test (BIST) is an effective way of enhancing the safety of automotive SoCs. The end result of such tests can communicate any abnormality in functioning of any part of the chip, ensuring ...
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