Automatic test pattern generation automatic test pattern generator is an electronic design automation method used to find an input sequence that, when applied to a digital circuit, enables automatic ...

Patterns created using advanced fault models provide higher test coverage, improved defect detection, and higher-yielding ...

As semiconductor devices advance in complexity and sensitivity to power fluctuations, the integration of power-aware automatic test pattern generation (ATPG) is becoming indispensable for yield and ...

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.